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Shiro, Ayumi*; Shobu, Takahisa; Okada, Tatsuya*
Zairyo, 71(4), p.354 - 360, 2022/04
Recrystallization process of an aluminum (Al) single crystal was observed in situ using synchrotron X-rays. Al single-crystalline samples were deformed in tension along a 111 direction to a strain of 8%, and were subsequently annealed at 753 K. The changes in the shape and intensity of diffraction spots were analyzed using a two-dimensional detector. A diffraction spot from the deformation matrix had three peaks which reflected a sub-grained microstructure of the sample. The observation during annealing unveiled the appearance of diffraction spots from a recrystallized grain at 330.8 s. As the diffraction spots from the recrystallized grain became larger, the diffraction spots from the deformation matrix gradually disappeared. The application of the X-ray topography method revealed the crystal orientation variation in a recrystallized grain in order of 0.001 degree.
Yoneda, Yasuhiro; Komura, Yoshiki*; Suzuki, Yoshio*; Hamazaki, Shinichi*; Takashige, Masaaki*
Journal of the Physical Society of Japan, 73(4), p.1050 - 1053, 2004/04
We have observed 90 C domain walls in a bulk BaTiO crystal by Synchrotron radiation topography, coupled with a CCD detector. The BaTiO multi-domain crystal was revealed to be strained at the 90 C domain boundary. The polar direction of the BaTiO crystal was tilted by this starin, and this strain also causes the irregular angle of the surface bending mode. The Synchrotron X-ray topography can be performed on a sample with electrodes. The topographic image of the ferroelectric doamin with an electric field clarified that the well-known stripe domain configuration can not be observed without a weak electric field due to the lattice strain at the doamin boundary.